Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography.
Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods.
As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization.
The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science.
With thoroughly revised and updated chapters and now containing about 20%
new material, this is the must-have, in-depth resource on this highly relevant topic.
